AdvBinomApps (version 1.0)

ci.syn: Upper Clopper-Pearson confidence limits under chip synergies

Description

Function to compute upper Clopper-Pearson confidence limits of failure probabilities on the basis of burn-in studies for each subset of a chip. Optionally, the required number of additional inspections for reaching a predefined target failure probability is returned.

Usage

ci.syn(k, n, alpha = 0.1, p.target = 1, tol = 1e-10)

Arguments

k

vector of numbers of failures for each subset.

n

vector of numbers of inspections for each subset.

alpha

alpha-level (1-alpha confidence level, default: 0.1).

p.target

target failure probability (optional).

tol

tolerance of uniroot-function used for computing p.hat (default: 1e-10).

Value

p.hat

upper Clopper-Pearson confidence limit of the failure probability of the assembled devices.

n.add

required number of additional inspections of each subset for reaching p.target.

References

D. Kurz, H. Lewitschnig and J. Pilz: Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Resubmitted to: Journal of Applied Statistics, 2015.

See Also

phi.syn phi.syn.cm ci.syn.cm

Examples

k<-c(0,1)
n<-c(110000,330000)
ci.syn(k,n,0.1,20e-06)

k<-c(1,0,1,5)
n<-c(330000,240000,240000,400000)
ci.syn(k,n,0.1,20e-06)