critValue

<p>Vector with calculated values of the statistic for each of
the <code>NREP</code> bootstraps; NREP is from <code>boot.sw98</code></p>

alpha

<p>Calculates critical value for test using bootstrap output
in DEA models
</p>

Methods for frontier
analysis, Data Envelopment Analysis (DEA), under different
technology assumptions (fdh, vrs, drs, crs, irs, add/frh, and fdh+),
and using different efficiency measures (input based, output based,
hyperbolic graph, additive, super, and directional efficiency). Peers
and slacks are available, partial price information can be included,
and optimal cost, revenue and profit can be calculated. Evaluation of
mergers is also supported.  Methods for graphing the technology sets
are also included. There is also support comparative methods based
on Stochastic Frontier Analyses (SFA). In general, the methods can be
used to solve not only standard models, but also many other model
variants. It complements the book, Bogetoft and Otto,
Benchmarking with DEA, SFA, and R, Springer-Verlag, 2011, but can of
course also be used as a stand-alone package.

critValue: Critical values from bootstrapped DEA models

Description

Usage

Arguments

Value

Details

See Also

Examples