critValue

Calculates critical value for test using bootstrap output
in DEA models

Methods for frontier
analysis, Data Envelopment Analysis (DEA), under different
technology assumptions (fdh, vrs, drs, crs, irs, add/frh, and fdh+),
and using different efficiency measures (input based, output based,
hyperbolic graph, additive, super, and directional efficiency). Peers
and slacks are available, partial price information can be included,
and optimal cost, revenue and profit can be calculated. Evaluation of
mergers is also supported.  Methods for graphing the technology sets
are also included. There is also support for comparative methods based
on Stochastic Frontier Analyses (SFA) and for convex nonparametric
least squares of convex functions (STONED). In general, the methods
can be used to solve not only standard models, but also many other
model variants. It complements the book, Bogetoft and Otto,
Benchmarking with DEA, SFA, and R, Springer-Verlag, 2011, but can of
course also be used as a stand-alone package.

Lars Otto

Benchmarking

Benchmark and Frontier Analysis Using DEA and SFA

critValue function

<dl>
<dt>s</dt>
<dd>Vector with calculated values of the statistic for each of
the <code>NREP</code> bootstraps; NREP is from <code>boot.sw98</code></dd>
<dt>alpha</dt>
<dd>The size of the test</dd>
</dl>

Arguments

Peter Bogetoft and Lars Otto <a href="/link/larsot23%40gmail.com?package=Benchmarking&version=0.32" data-mini-rdoc="Benchmarking::larsot23@gmail.com">larsot23@gmail.com</a>

Author

Critical values from bootstrapped DEA models — critValue

<dl>


<dt>s</dt>
<dd>Vector with calculated values of the statistic for each of
the <code>NREP</code> bootstraps; NREP is from <code>boot.sw98</code></dd>


<dt>alpha</dt>
<dd>The size of the test</dd>


</dl>

Peter Bogetoft and Lars Otto <a href='mailto:larsot23@gmail.com'>larsot23@gmail.com</a>

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critValue: Critical values from bootstrapped DEA models

Description

Usage

Value

Arguments

Author

Details

See Also

Examples