fitting methods
For all options (except the LIN in the option the EXP OR LIN) nls function with the port algorithm is used. LIN: fit a linear function to the data using lm:
$$y = mx+n$$
EXP: try to fit a function of the form $$y = a*(1-exp(-(x+c)/b))$$
Parameter b and c are approximated by a linear fit using lm.
EXP OR LIN: works for some cases where a EXP fit failes. If the EXP fit failes a LIN
fit is done instead.
EXP+LIN: try to fit a exponential plus linear function of the form:
$$y = a*(1-exp(-(x+c)/b)+(g*x))$$
The De is calculated by iteration.
Note: In the context of luminescence dating this function has no physical meaning. Therefore no
D0 value is returned.
EXP+EXP: try to fit a double exponential function of the form
$$y = (a1*(1-exp(-(x)/b1)))+(a2*(1-exp(-(x)/b2)))$$
This fitting is highly resilent against wrong start parameters and should be further improved.
fit weighting (suggest by Michael Dietze and Margret Fuchs)
If the option fit.weights=TRUE weights are calculated using provided signal errors (Lx/Tx error) using the equation:
$$fit.weights = 1/error/(sum(1/error))$$
error estmation using Monte Carlo simulation
Error estimation is done using a Monte Carlo (MC) simulation approach. A set of input values is constructed by
randomly drawing curve data from a normal distribution. The normal distribution is defined by the input values (mean=value, sd=value.error).
Then a growth curve fit is tried for each dataset which results in new distribution of values. The sd
of this distribution is the error of the De. With increasing iterations the error value is becoming more
stable. Note: It may take some calculation time with increaing MC runs especially for the composed functions (EXP+LIN
and EXP+EXP).
Every error estimation is done with the function of the chosen fitting method.