Description
Contains time until failure in hours for a particular electronic
component subjected to an accelerated stress test.source
Ugarte, M. D., Militino, A. F., and Arnholt, A. T. (2008)
Probability and Statistics with R. Chapman & Hall/CRC.Examples
Run this codeattach(GD)
hist(attf,prob=TRUE)
lines(density(attf))
detach(GD)
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