SiRstv

Measurements of bulk resistivity of silicon wafers made at NIST with 5
probing instruments on each of 5 days.

datasets

Data for the examples and exercises in the book "R by Example".
Jim Albert and Maria Rizzo (2012, ISBN 978-1-4614-1365-3).

25 obs. of 2 variables:<dl>
<dt>Instrument</dt>
<dd>replicate</dd><dt>Resistance</dt>
<dd>resistance</dd>
</dl>

25 obs. of 2 variables:<dl>
<dt>Instrument</dt>
<dd>replicate</dd>

<dt>Resistance</dt>
<dd>resistance</dd>


</dl>