testdata

A dataset containing example reliability test data from the military report
"Reliability Growth Prediction" (1986) by The Analytical Sciences Corporation.
This dataset includes cumulative ETI, failure counts, cumulative MTBF, report
numbers, flags, and causes for two different LRUs (G1 and G2).

datasets

Modeling and plotting functions for Reliability Growth Analysis (RGA). Models include the Duane (1962) <doi:10.1109/TA.1964.4319640>, Non-Homogeneous Poisson Process (NHPP) by Crow (1975) (No. AMSAATR138), Piecewise Weibull NHPP by Guo et al. (2010) <doi:10.1109/RAMS.2010.5448029>, and Piecewise Weibull NHPP with Change Point Detection based on the 'segmented' package by Muggeo (2024) <https://cran.r-project.org/package=segmented>.

Paul Govan

ReliaGrowR

Reliability Growth Analysis

testdata function

@format ## <code>testdata</code>
A data frame with 25 rows and 6 variables:<dl>
<dt>LRU</dt>
<dd>The Line Replaceable Unit identifier (G1 or G2).</dd><dt>Cum_ETI</dt>
<dd>Cumulative Equivalent Test Hours (ETI).</dd><dt>Failure_Count</dt>
<dd>Cumulative number of failures observed.</dd><dt>Cum_MTBF</dt>
<dd>Cumulative Mean Time Between Failures (MTBF).</dd><dt>Report_No</dt>
<dd>Report number associated with the failure.</dd><dt>Flag</dt>
<dd>A flag indicating special conditions or notes.</dd><dt>Cause</dt>
<dd>Cause of the failure (e.g., D for Design, M for Manufacturing, R for Random, NR for No Report).</dd>
</dl>@usage data(testdata)

Format

Reliability Test Data — testdata

@format ## <code>testdata</code>
A data frame with 25 rows and 6 variables:<dl>
<dt>LRU</dt>
<dd>The Line Replaceable Unit identifier (G1 or G2).</dd>

<dt>Cum_ETI</dt>
<dd>Cumulative Equivalent Test Hours (ETI).</dd>

<dt>Failure_Count</dt>
<dd>Cumulative number of failures observed.</dd>

<dt>Cum_MTBF</dt>
<dd>Cumulative Mean Time Between Failures (MTBF).</dd>

<dt>Report_No</dt>
<dd>Report number associated with the failure.</dd>

<dt>Flag</dt>
<dd>A flag indicating special conditions or notes.</dd>

<dt>Cause</dt>
<dd>Cause of the failure (e.g., D for Design, M for Manufacturing, R for Random, NR for No Report).</dd>


</dl>@usage data(testdata)

testdata: Reliability Test Data

Description

Usage

Arguments

Format

Examples