uniform.crit calculates the wrap-around discrepancy of a design. The wrap-around discrepancy for a design \(D=[\bm x_1, \dots, \bm x_n]^T\) is defined as (Hickernell, 1998):
$$\phi_{wa} = -\left(\frac{4}{3}\right)^p + \frac{1}{n^2}\sum_{i,j=1}^n\prod_{k=1}^p\left[\frac{3}{2} - |x_{ik}-x_{jk}|(1-|x_{ik}-x_{jk}|)\right].$$