test_cluster-class

<code><a href="/link/?package=TestDesign&version=1.2.4" test_cluster'="" data-mini-rdoc="TestDesign::"></a>'>test_cluster</code> is an S4 class to represent data for test assembly.

Use the optimal test design approach by Birnbaum (1968, ISBN:9781593119348) and
van der Linden (2018) <doi:10.1201/9781315117430> in constructing fixed and adaptive tests. Supports the following
mixed-integer programming (MIP) solver packages: 'lpsymphony', 'Rsymphony', 'gurobi', 'lpSolve', and 'Rglpk'. The 'gurobi' package
is not available from CRAN; see <https://www.gurobi.com/downloads/>. See vignette for installing 'Rsymphony' package
on Mac systems.

Seung W. Choi

TestDesign

Optimal Test Design Approach to Fixed and Adaptive Test
Construction

Sangdon Lim

test_cluster-class function

<dl class="dl-horizontal">
<dt><code>nt</code></dt><dd>the number of <code><a href="/link/?package=TestDesign&version=1.2.4" test'="" data-mini-rdoc="TestDesign::"></a>'>test</code> objects in this cluster.</dd></dl><dt><code>tests</code></dt><dd>the list containing <code><a href="/link/?package=TestDesign&version=1.2.4" test'="" data-mini-rdoc="TestDesign::"></a>'>test</code> objects.</dd><dt><code>names</code></dt><dd>test ID strings for each <code><a href="/link/?package=TestDesign&version=1.2.4" test'="" data-mini-rdoc="TestDesign::"></a>'>test</code> object.</dd>

Slots

<code><a href='<a href='test_cluster'></a>'>test_cluster</a></code> is an S4 class to represent data for test assembly.

test_cluster-class: Class 'test_cluster': data for test assembly

Description

Arguments

Slots