test_cluster-class

<code>test_cluster</code> is an S4 class for representing data cache for running simulations.
Despite the name, this class does not represent a series of tests and is not related to a series of tests. That is, test length is not stored in this class.
This class is only kept for backwards compatibility.

Uses the optimal test design approach by Birnbaum (1968, ISBN:9781593119348) and
van der Linden (2018) <doi:10.1201/9781315117430> to construct fixed, adaptive, and parallel tests.
Supports the following mixed-integer programming (MIP) solver packages: 'Rsymphony',
'highs', 'gurobi', 'lpSolve', and 'Rglpk'. The 'gurobi' package is not available from CRAN; see <https://www.gurobi.com/downloads/>.

Seung W. Choi

TestDesign

Optimal Test Design Approach to Fixed and Adaptive Test
Construction

Sangdon Lim

test_cluster-class function

<dl>
<dt><code>nt</code></dt>
<dd>the number of <code>test</code> objects in this cluster.</dd></dl>
<dt><code>tests</code></dt>
<dd>the list containing <code>test</code> objects.</dd>
<dt><code>names</code></dt>
<dd>test ID strings for each <code>test</code> object.</dd>

Slots

Class 'test_cluster': data cache for simulations — test_cluster-class

<dl>
<dt><code>nt</code></dt>
<dd>the number of <code>test</code> objects in this cluster.</dd>


<dt><code>tests</code></dt>
<dd>the list containing <code>test</code> objects.</dd>


<dt><code>names</code></dt>
<dd>test ID strings for each <code>test</code> object.</dd>


</dl>

test_cluster-class: Class 'test_cluster': data cache for simulations

Description

Arguments

Slots