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Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies et al. (2008).
| Package: | diffractometry |
| Type: | Package |
| Version: | 0.1-02 |
| Date: | 2010-03-05 |
| License: | GPL (>= 2) |
The package diffractometry contains an implementation of the automatic procedure for analysing x-ray diffractograms of thin films introduced in Davies et al. (2008). The function diffractogram can be used for a complete analysis, while baselinefit and pkdecomp perform baseline estimation and peak decomposion separately. The dataset indiumoxide is the diffractogram used as an example in the article.
P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008): "Residual based localization and quantification of peaks in x-ray diffractograms", Annals of Applied Statistics, Vol. 2, No. 3, 861-886.. http://www.statistik.tu-dortmund.de/fileadmin/user_upload/Lehrstuehle/MSind/Publikationen/2008/2008_-_Davies_Gather_Meise_Mergel_Mildenberger_-_Residual_based_localization_and_quantification_of_peaks_in_x-ray_diffractograms.pdf