Example of a diffractogram used in Davies et al. (2008)
data(indiumoxide)The diffractogram was taken on a thin film of \(In_2 O_3 :Sn\), i.e. indium oxide doped with tin. This material is usually called ITO (indium-tin-oxide). It has a good electrical conductivity and is transparent in the visible wave length region. The first column of the matrix contains the angles of diffraction, the second column contains the corresponding photon counts.
P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008): "Residual based localization and quantification of peaks in x-ray diffractograms", Annals of Applied Statistics, Vol. 2, No. 3, 861-886.. http://www.statistik.tu-dortmund.de/fileadmin/user_upload/Lehrstuehle/MSind/Publikationen/2008/2008_-_Davies_Gather_Meise_Mergel_Mildenberger_-_Residual_based_localization_and_quantification_of_peaks_in_x-ray_diffractograms.pdf