ELECFAIL

50 failure times of an electronic device.

datasets

This R package is providing all the data sets and statistical analysis applications used in Modern Industrial Statistics, with applications using R, MINITAB and JMP by R.S. Kenett and S. Zacks with contributions by D. Amberti, John Wiley and Sons, 2013, which is a second revised and expanded revision of Modern Industrial Statistics: Design and Control of Quality and Reliability, R. Kenett and S. Zacks, Duxbury/Wadsworth Publishing, 1998.

Daniele Amberti

mistat

Data sets, functions and examples from the book:"Modern
        Industrial Statistics" by Kenett, Zacks and Amberti

ELECFAIL function

Kenett, R. and Zacks, S. (1998)
  <em>Modern Industrial Statistics: The Design and Control of Quality and Reliability</em>.
  Duxbury Press.

ELECFAIL: Failures of an Electronic Device

Description

Usage

Arguments

source

Examples